Effects of pH Value and Surfactant on Silicon Sol CMP Slurry

ZHANG Lin-qi, ZOU Wen-jun, XIA Lin, PENG Jin

Surface Technology ›› 2014, Vol. 43 ›› Issue (4) : 24-26,36.

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PDF(3072 KB)
Surface Technology ›› 2014, Vol. 43 ›› Issue (4) : 24-26,36.
Research and Exploration

Effects of pH Value and Surfactant on Silicon Sol CMP Slurry

  • ZHANG Lin-qi, ZOU Wen-jun, XIA Lin, PENG Jin
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Abstract

Objective On the basis of preparing silicon sol polishing liquid for CMP process, the effects of pH value and surfactants on the reliability and properties of CMP slurry were studied. Methods Different pH values of CMP polishing liquid were configured through adding acidic or alkaline pH adjusting agent into the polishing liquid. The stabilizing mechanism of surfactants on the polishing solution was studied. Results When the pH of CMP solution was 9. 5, and Non-ionic surfactant was added, after 90 min, the surface roughness of polished aluminum alloy was decreased by 55. 4% , and the brightness was increased by 131% . The polishing quality of aluminum alloy surface was good. Conclusion Research showed the excellent stability and polishing performance of the polishing solution in weakly alkaline condition. Non-ionic surfactants were beneficial to the stability of CMP polishing liquid.

Key words

silica sol; CMP slurry; pH value; surfactant

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ZHANG Lin-qi, ZOU Wen-jun, XIA Lin, PENG Jin. Effects of pH Value and Surfactant on Silicon Sol CMP Slurry[J]. Surface Technology. 2014, 43(4): 24-26,36

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Supported by National Natural Science Foundation(11076010A06)
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