Study on Deposition of a-C:H Film by Reactive DC Magnetron Sputtering and Its Surface Roughness

ZHANG Yan-ru, HANG Ling-xia, GUO Feng, NING Xiao-yang

Surface Technology ›› 2013, Vol. 42 ›› Issue (2) : 92-94,121.

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PDF(3466 KB)
Surface Technology ›› 2013, Vol. 42 ›› Issue (2) : 92-94,121.
Applied Technology

Study on Deposition of a-C:H Film by Reactive DC Magnetron Sputtering and Its Surface Roughness

  • ZHANG Yan-ru, HANG Ling-xia, GUO Feng, NING Xiao-yang
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Abstract

The —CH3 atoms methane gas was filled to study the preparation and performance of the hydrogen-containing DLC( a-C:H) thin film. At different CH4 / Ar flow ratio condition, the a-C:H was deposited on the N type silicon substrate. By means of ellipsometer, the non-contact white light interferometer as well as the laser wave interferometer, the deposition rate and surface roughness were lucubrated. Experiment results show that the deposition rate of the diamond-like carbon thin film is enhanced by the addition of the hydrogen-containing carbon gas and the surface flatness is also improved.

Key words

reactive DC magnetron sputtering; DLC films with various hydrogen contents; deposition rate; surfaceroughness

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ZHANG Yan-ru, HANG Ling-xia, GUO Feng, NING Xiao-yang. Study on Deposition of a-C:H Film by Reactive DC Magnetron Sputtering and Its Surface Roughness[J]. Surface Technology. 2013, 42(2): 92-94,121
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