Analysis of Aluminum Deposition on Inner Wall of Pipes with Atomic Layer Deposition

LIU Heng, XIONG Yu-qing, WANG Ji-zhou

Surface Technology ›› 2012, Vol. 41 ›› Issue (3) : 47-50.

PDF(3301 KB)
PDF(3301 KB)
Surface Technology ›› 2012, Vol. 41 ›› Issue (3) : 47-50.
Research and Exploration

Analysis of Aluminum Deposition on Inner Wall of Pipes with Atomic Layer Deposition

  • LIU Heng, XIONG Yu-qing, WANG Ji-zhou
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Abstract

The feasibility of aluminum deposition on inner wall of waveguide by atomic layer deposition was studied. First, by solving adsorption kinetics equation based on gas on the pipe inner wall, the time for the reactant to reach saturated adsorption on the basis was calculated. Then, according to the aluminum crystal structure, the thickness of each deposition cycle was obtained. Finally, the minimum aluminum thickness and number of atomic layer deposition cycles that can meet electromagnetic requirement of wave guide was calculated.

Key words

atomic layer deposition; inner wall; waveguide;aluminum

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LIU Heng, XIONG Yu-qing, WANG Ji-zhou. Analysis of Aluminum Deposition on Inner Wall of Pipes with Atomic Layer Deposition[J]. Surface Technology. 2012, 41(3): 47-50
PDF(3301 KB)

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