GUO Ting,ZUO Xiao,GUO Peng,LI Xiao-wei,WU Xiao-chun,XIE Shi-fang,WANG Ai-ying.Effect of Etching Process on Growth and Properties of Tetrahedral Amorphous Carbon Film[J],46(4):143-149
Effect of Etching Process on Growth and Properties of Tetrahedral Amorphous Carbon Film
Received:December 01, 2016  Revised:April 20, 2017
View Full Text  View/Add Comment  Download reader
DOI:10.16490/j.cnki.issn.1001-3660.2017.04.024
KeyWord:tetrahedral amorphous carbon film  glow etching  arc etching  etching time  structure
                    
AuthorInstitution
GUO Ting 1.School of Materials Science and Engineering, Shanghai University, Shanghai , China; 2. a. Key Laboratory of Marine Materials and Related Technologies, b. Zhejiang Key Laboratory of Marine Materials of Protective Technologies, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo , China
ZUO Xiao a. Key Laboratory of Marine Materials and Related Technologies, b. Zhejiang Key Laboratory of Marine Materials of Protective Technologies, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo , China
GUO Peng a. Key Laboratory of Marine Materials and Related Technologies, b. Zhejiang Key Laboratory of Marine Materials of Protective Technologies, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo , China
LI Xiao-wei a. Key Laboratory of Marine Materials and Related Technologies, b. Zhejiang Key Laboratory of Marine Materials of Protective Technologies, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo , China
WU Xiao-chun School of Materials Science and Engineering, Shanghai University, Shanghai , China
XIE Shi-fang Institute of Applied Physics, Jiangxi Academy of Sciences, Nanchang , China
WANG Ai-ying a. Key Laboratory of Marine Materials and Related Technologies, b. Zhejiang Key Laboratory of Marine Materials of Protective Technologies, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo , China
Hits:
Download times:
Abstract:
      The work aims to study effects of different plasma etching processes on silicon substrate and tetrahedral amorphous carbon (ta-C) films, and further survey effects of different arc plasma etching time on ta-C films. Etching of different plasma and deposition of ta-C films were performed by a home-made 45º bend magnetic filtered cathodic vacuum arc (FCVA) coater. Plasma types and density were characterized with optical emission spectrometer (OES); thickness of ta-C films with ellipsometer; roughness of treated substrates after etching with atomic force microscope (AFM); the film structure with Raman spectroscopy and XPS; and film-to-substrate interface structure was analyzed with TEM, representatively. The results showed that the Ar+ of low density dominated in the effective plasma of glow etching process while Ar+ of high density and a few C+ emerged in arc plasma etching process. After the arc plasma etching, a nearly 15 nm thick interface layer was formed on the substrates surface, and pre-deposition of amorphous carbon film (a-C) was observed. Moreover, sp3 content of the ta-C film decreased as the arc etching time increased. Compared with glow etching process, arc etching facilitates the deposition of thicker ta-C films, primarily due to the formation of interfacial layer on the substrate surface and the pre-deposition of amorphous carbon films layer in arc etching, which contributes to formation of a special a-C/ta-C gradient film structure and improvement of adhesion strength.
Close