YUAN Wei-shuang,LI Jin,ZHANG Sa,DU Yi-Ii.Applications of Atomic Force Microscopy to Microbiologically Induced Corrosion[J],36(6):30-32,35 |
Applications of Atomic Force Microscopy to Microbiologically Induced Corrosion |
Received:September 16, 2007 Revised:December 10, 2007 |
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KeyWord:Atomic force microscopy Sulfate-reducing bacteria Biofilm Corrosion |
Author | Institution |
YUAN Wei-shuang |
School of Civil Engineering and Architecture, Beijing Jiaotong University, Beijing , China |
LI Jin |
School of Civil Engineering and Architecture, Beijing Jiaotong University, Beijing , China |
ZHANG Sa |
National Center of Biomedical Analysis, Beijing , China |
DU Yi-Ii |
School of Civil Engineering and Architecture, Beijing Jiaotong University, Beijing , China |
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Abstract: |
Atomic force microscopy ( AFM) was applied to obtain high-resolution topographical images of sulfate-reducing bacteria, and to observe the biofilms developed on the BFe30-1-1 copper alloy. The use of AFM image analysis software allowed estimation of the width and height of bacterial cells, and the characterization of the surface roughness of the copper alloy, including measurements of depth and diameter of individual pits. Following the removal of biofilms, the copper alloy surfaces were profiled using AFM to determine the degree of copper alloy deterioration. |
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