胡宗林,陆玲,庄维伟.哈氏合金C-276电抛光中抛光液的失效分析[J].表面技术,2017,46(5):255-260.
HU Zong-lin,LU Ling,ZHUANG Wei-wei.Failure Analysis of Electrolyte in E-polishing Process of Hastelloy Alloy C-276[J].Surface Technology,2017,46(5):255-260
哈氏合金C-276电抛光中抛光液的失效分析
Failure Analysis of Electrolyte in E-polishing Process of Hastelloy Alloy C-276
投稿时间:2016-12-20  修订日期:2017-05-20
DOI:10.16490/j.cnki.issn.1001-3660.2017.05.041
中文关键词:  哈氏合金  电化学抛光  抛光液  粗糙度
英文关键词:Hastelloy alloy  electrochemical polishing  polishing agent  roughness
基金项目:江苏省科技成果转化专项资金招标项目(BA2015029)
作者单位
胡宗林 苏州新材料研究所有限公司,江苏 苏州215125 
陆玲 苏州新材料研究所有限公司,江苏 苏州215125 
庄维伟 苏州新材料研究所有限公司,江苏 苏州215125 
AuthorInstitution
HU Zong-lin Suzhou Advanced Materials Research Institute, Suzhou 215125, China 
LU Ling Suzhou Advanced Materials Research Institute, Suzhou 215125, China 
ZHUANG Wei-wei Suzhou Advanced Materials Research Institute, Suzhou 215125, China 
摘要点击次数:
全文下载次数:
中文摘要:
      目的 哈氏合金C-276带材被广泛用作第二代高温超导体YBCO的金属衬底,其表面抛光质量(粗糙度Ra)要求极为严格。为了保证抛光质量就要有效控制电化学抛光液,对抛光液的变化及失效与否进行分析。方法 以哈氏合金C-276带材为研究对象,采用非接触式电化学抛光方法,使用扫描电镜、原子力显微镜、金相显微镜、微波等离子体原子发射光谱仪等仪器设备,阐明了抛光液中H3PO4和H2SO4等主要成分的作用及工艺要求,并测定单位体积抛光液在一定时间内通过电量(Ah/L)后,H3PO4、H2SO4含量及Ni、Cr、Mo等金属离子浓度。结果 当H3PO4、H2SO4含量分别在775~1013 g/L、318~451 g/L范围内,Ni、Cr、Mo三种金属离子质量浓度分别小于7.3、2.7、3.4 g/L时,C-276带材表面的粗糙度才能满足工艺要求Ra<1 nm(5 μm× 5 μm)。结论 通过对电化学抛光液中的H3PO4、H2SO4、添加剂、金属离子浓度等有效控制,采用非接触式电化学抛光,实现了千米级哈氏合金第二代高温超导带材的连续生产,并且表面粗糙度Ra<1 nm。
英文摘要:
      Hastelloy alloy C-276 strip has been widely used as metallic substrate of YBCO second generation high temperature su-perconductor. The alloy is subject to strict requirements regarding surface polishing quality (roughness Ra in the work). Electrochemical polishing agent shall be controlled effectively and analyzed for variation and failure to guarantee polishing quality. With C-276 strip as object of study, non-contact electrochemical polishing method as well as instruments including SEM, AFM, metallographic microscope and microwave plasma atomic emission spectrometer were used. Functions and process requirements of main components including H3PO4 and H2SO4 in polishing agent were elaborated. Content of H3PO4 and H2SO4, and ionic concentration of Ni, Cr and Mo were measured after unit volume polishing agent passes through electric quantity in certain period (Ah/L). C-276 strip surface roughness will not meet the process requirements Ra <1 nm (5 μm× 5 μm) unless content of phosphoric acid and sulfuric acid fell within 775~1013 g/L and 318~451 g/L, ionic concentration of Ni, Cr, Mo was<7.3 g/L, 2.7 g/L, 3.4 g/L, respectively. Non-contact electrochemical polishing is used to achieve continuous production of the second-generation high-temperature superconducting tapes of kilometric Hastelloy based on effective control of sulfuric acid, phosphoric acid, additives and metal ion concentration in electrochemical polishing agent. The surface roughness Ra is < 1 nm.
查看全文  查看/发表评论  下载PDF阅读器
关闭

关于我们 | 联系我们 | 投诉建议 | 隐私保护 | 用户协议

您是第20632505位访问者    渝ICP备15012534号-3

版权所有:《表面技术》编辑部 2014 surface-techj.com, All Rights Reserved

邮编:400039 电话:023-68792193传真:023-68792396 Email: bmjs@surface-techj.com

渝公网安备 50010702501715号