蒋光锐,滕华湘,张浩,刘李斌,李春光.冷轧薄板表面波纹度评价标准研究[J].表面技术,2013,42(5):112-115.
JIANG Guang-rui,TENG Hua-xiang,ZHANG Hao,LIU Li-bin,LI Chun-guang.Study on Measurement Standards of Waviness on Cold Rolled Sheet[J].Surface Technology,2013,42(5):112-115 |
| 冷轧薄板表面波纹度评价标准研究 |
| Study on Measurement Standards of Waviness on Cold Rolled Sheet |
| 投稿时间：2013-05-23 修订日期：2013-06-10 |
| DOI： |
| 中文关键词: 波纹度 高斯滤波器 冷轧薄板 涂漆外观 |
| 英文关键词:waviness gaussian filter cold rolled sheet paint appearance |
| 基金项目: |
| 作者 | 单位 |
| 蒋光锐 | 首钢技术研究院, 北京 100043 |
| 滕华湘 | 首钢技术研究院, 北京 100043;北京科技大学 材料科学与工程学院, 北京 100083 |
| 张浩 | 首钢技术研究院, 北京 100043 |
| 刘李斌 | 首钢技术研究院, 北京 100043;北京科技大学 新金属材料国家重点实验室, 北京 100083 |
| 李春光 | 首钢技术研究院, 北京 100043;东北大学 材料与冶金学院, 沈阳 110004 |
|
| Author | Institution |
| JIANG Guang-rui | Shougang Research Institute of Technology, Beijing 100043 , China |
| TENG Hua-xiang | Shougang Research Institute of Technology, Beijing 100043 , China;School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China |
| ZHANG Hao | Shougang Research Institute of Technology, Beijing 100043 , China |
| LIU Li-bin | Shougang Research Institute of Technology, Beijing 100043 , China;State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing,Beijing 100083 , China |
| LI Chun-guang | Shougang Research Institute of Technology, Beijing 100043 , China;School of Materials and Metallurgy, Northeastern University, Shenyang 110004 , China |
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| 中文摘要: |
| 使用高通高斯滤波-低通高斯滤波、高通指数滤波-低通指数滤波和多项式滤波-低通高斯滤波三种波纹度测量方法,测量并计算了冷轧薄板表面的波纹度,分析了滤波方式以及测量长度对波纹度测量结果的影响。 分析表明:采用高通高斯滤波-低通高斯滤波方法获得的波纹度参数偏大,并且数据重复性差;而采用高通指数滤波-低通指数滤波方法得到的波纹度参数偏小。 进一步研究表明,采用高通指数滤波-低通指数滤波方法得到的波纹度参数受测量长度的影响很小。 |
| 英文摘要: |
| The waviness on cold rolled sheet was measured and calculated by following three methods: high pass Gaussian filter with low pass Gaussian filter, high pass exponent filter with low pass exponent filter and polynomial filter with low pass Gaussian filter. The effect of filtering techniques and measuring length on the results of waviness parameter was analyzed. It indicates that application of high pass Gaussian filter with low pass Gaussian filter leads to higher and unstable results. Moreover,the waviness parameter based on the methods of high pass exponent filter with low pass exponent filter and polynomial filter with low pass Gaussian filter is stable on measuring length. |
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