李文华,李爽,卢文将,赵月山.铁路继电器触点表面形貌及失效机理分析[J].表面技术,2018,47(8):236-243. LI Wen-hua,LI Shuang,LU Wen-jiang,ZHAO Yue-shan.Analysis of Surface Morphology and Failure Mechanism of Railway Relay Contacts[J].Surface Technology,2018,47(8):236-243 |
铁路继电器触点表面形貌及失效机理分析 |
Analysis of Surface Morphology and Failure Mechanism of Railway Relay Contacts |
投稿时间:2018-04-21 修订日期:2018-08-20 |
DOI:10.16490/j.cnki.issn.1001-3660.2018.08.032 |
中文关键词: 铁路继电器 表面形貌 表面元素 粗糙度参数 失效机理分析 材料转移 |
英文关键词:railway relay surface topography analysis surface element analysis roughness parameters failure mechanism analysis material transfer |
基金项目: |
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Author | Institution |
LI Wen-hua | National Key Laboratory Co-Founded by Tianjin and Ministry of Education for Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China |
LI Shuang | National Key Laboratory Co-Founded by Tianjin and Ministry of Education for Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China |
LU Wen-jiang | National Key Laboratory Co-Founded by Tianjin and Ministry of Education for Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China |
ZHAO Yue-shan | National Key Laboratory Co-Founded by Tianjin and Ministry of Education for Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China |
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中文摘要: |
目的 深入研究铁路继电器触点的失效机理。方法 在直流条件下进行铁路继电器电寿命试验,自动识别静触点表面与动触点的接触区域。利用三维形貌扫描仪和扫描电镜扫描触点,选定平面基准面,计算触点表面粗糙度参数,分析触点表面形貌变化。对触点烧蚀后的表面进行元素分析,研究触点表面的微观组织结构和失效机理。结果 Sa/Sq的值小于 0.8 表示随机性较强的表面, Sa/Sq(静)=0.246 |
英文摘要: |
The work aims to study the failure mechanism of railway relay contacts. The electric relay electric life test was carried out under the direct current condition to automatically recognize the contact area between the static contact surface and the moving contact. 3D topography scanner and SEM were used to scan the contacts, the plane reference surface was selected, the contact surface roughness parameters were calculated, and the surface topography changes of the contact surfaces were analyzed. Elemental analysis was performed on the ablated surface of the contact to investigate the microstructure and failure mechanism of the contact surface. The Sa/Sq value less than 0.8 indicated a random surface. For Sa/Sq (static) =0.246 |
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