苑维双,李进,张飒,杜一立.原子力显微镜在微生物腐蚀研究中的应用[J].表面技术,2007,36(6):30-32,35.
YUAN Wei-shuang,LI Jin,ZHANG Sa,DU Yi-Ii.Applications of Atomic Force Microscopy to Microbiologically Induced Corrosion[J].Surface Technology,2007,36(6):30-32,35 |
| 原子力显微镜在微生物腐蚀研究中的应用 |
| Applications of Atomic Force Microscopy to Microbiologically Induced Corrosion |
| 投稿时间：2007-09-16 修订日期：2007-12-10 |
| DOI： |
| 中文关键词: 原子力显微镜 硫酸盐还原茵 微生物膜 腐蚀 |
| 英文关键词:Atomic force microscopy Sulfate-reducing bacteria Biofilm Corrosion |
| 基金项目: |
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| Author | Institution |
| YUAN Wei-shuang | School of Civil Engineering and Architecture, Beijing Jiaotong University, Beijing 100044, China |
| LI Jin | School of Civil Engineering and Architecture, Beijing Jiaotong University, Beijing 100044, China |
| ZHANG Sa | National Center of Biomedical Analysis, Beijing 100850, China |
| DU Yi-Ii | School of Civil Engineering and Architecture, Beijing Jiaotong University, Beijing 100044, China |
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| 中文摘要: |
| 利用原子力显微镜( Atomic Force Microscopy，AFM)研究硫酸盐还原茵（Sulfate Reducing Bacteria，SRB）、微生物膜和腐蚀前后铜合金材料BFe30-1-1的表面形貌，得到了高分辨率的表面形貌图，测得SRB的大小、点蚀坑的深度和直径，分析了腐蚀后BFe30-1-1的表面粗糙度参数。结合电化学参数说明，浸蚀14d的铜合金表面形成了不均匀的微生物膜，加速了试片表面的局部腐蚀。AFM作为一种具有纳米级分辨成像能力的工具，是观察材料的表面特征和腐蚀形貌及测量材料表面纳米粗糙度的理想仪器。 |
| 英文摘要: |
| Atomic force microscopy ( AFM) was applied to obtain high-resolution topographical images of sulfate-reducing bacteria, and to observe the biofilms developed on the BFe30-1-1 copper alloy. The use of AFM image analysis software allowed estimation of the width and height of bacterial cells, and the characterization of the surface roughness of the copper alloy, including measurements of depth and diameter of individual pits. Following the removal of biofilms, the copper alloy surfaces were profiled using AFM to determine the degree of copper alloy deterioration. |
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